Charging phenomena observed on biological specimens in a 400-kV electron cryo-microscope

Jaap Brink, Michael Sherman, John Berriman, Wah Chiu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

There is an ever present need in electron microscopy of biological specimens to improve the quality of the recorded data to approach the atomic resolution capability of the modern instruments. Spot-scan imaging has been shown to improve the image quality by reducing the beam-induced movement. Charging of the specimen appears to cause similar deleterious effects on image resolution, but it requires different methods aimed at resolution improvement. Proteins are insulators and because of secondary electron loss they will become positively charged during irradiation. A comparison was made of the degree of charging and discharging between using 100 and 400 keV electrons on streptavidin crystals in amorphous ice.

Original languageEnglish (US)
Title of host publicationProceedings - Annual Meeting, Microscopy Society of America
EditorsG.W. Bailey, A.J. Garratt-Reed
Pages118-119
Number of pages2
StatePublished - 1994
Externally publishedYes
EventProceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA
Duration: Jul 31 1994Aug 5 1994

Other

OtherProceedings of the 52nd Annual Meeting of the Microscopy Society of America
CityNew Orleans, LA, USA
Period7/31/948/5/94

Fingerprint

Microscopes
Electrons
Image resolution
Image quality
Electron microscopy
Ice
Irradiation
Proteins
Imaging techniques
Crystals

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Brink, J., Sherman, M., Berriman, J., & Chiu, W. (1994). Charging phenomena observed on biological specimens in a 400-kV electron cryo-microscope. In G. W. Bailey, & A. J. Garratt-Reed (Eds.), Proceedings - Annual Meeting, Microscopy Society of America (pp. 118-119)

Charging phenomena observed on biological specimens in a 400-kV electron cryo-microscope. / Brink, Jaap; Sherman, Michael; Berriman, John; Chiu, Wah.

Proceedings - Annual Meeting, Microscopy Society of America. ed. / G.W. Bailey; A.J. Garratt-Reed. 1994. p. 118-119.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Brink, J, Sherman, M, Berriman, J & Chiu, W 1994, Charging phenomena observed on biological specimens in a 400-kV electron cryo-microscope. in GW Bailey & AJ Garratt-Reed (eds), Proceedings - Annual Meeting, Microscopy Society of America. pp. 118-119, Proceedings of the 52nd Annual Meeting of the Microscopy Society of America, New Orleans, LA, USA, 7/31/94.
Brink J, Sherman M, Berriman J, Chiu W. Charging phenomena observed on biological specimens in a 400-kV electron cryo-microscope. In Bailey GW, Garratt-Reed AJ, editors, Proceedings - Annual Meeting, Microscopy Society of America. 1994. p. 118-119
Brink, Jaap ; Sherman, Michael ; Berriman, John ; Chiu, Wah. / Charging phenomena observed on biological specimens in a 400-kV electron cryo-microscope. Proceedings - Annual Meeting, Microscopy Society of America. editor / G.W. Bailey ; A.J. Garratt-Reed. 1994. pp. 118-119
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