Decontamination of digital image sensors and assessment of electron microscope performance in a BSL-3 containment

Michael Sherman, Juan Trujillo, Benjamin E. Bammes, Liang Jin, Matthias W. Stumpf, Scott Weaver

Research output: Contribution to journalArticle

Abstract

A unique biological safety level (BSL)-3 cryo-electron microscopy facility with a 200 keV high-end cryo-electron microscope has been commissioned at the University of Texas Medical Branch (UTMB) to study the structure of viruses and bacteria classified as select agents. We developed a microscope decontamination protocol based on chlorine dioxide gas with a continuous flow system. In this paper we report on testing digital camera sensors (both CCD and CMOS direct detector) in a BSL-3 environment, and microscope performance after chlorine dioxide (ClO2) decontamination cycles.

Original languageEnglish (US)
Pages (from-to)153-162
Number of pages10
JournalAIMS Biophysics
Volume2
Issue number2
DOIs
StatePublished - 2015

Fingerprint

Decontamination
Image sensors
Microscopes
Electron microscopes
Electrons
Cryoelectron Microscopy
Safety
Viral Structures
Digital cameras
Viruses
Charge coupled devices
Electron microscopy
Bacteria
Gases
Detectors
Sensors
Testing
chlorine dioxide

Keywords

  • Biological safety containment
  • Cryo-electron microscopy
  • Single particle imaging

ASJC Scopus subject areas

  • Biophysics
  • Structural Biology
  • Molecular Biology
  • Biochemistry

Cite this

Decontamination of digital image sensors and assessment of electron microscope performance in a BSL-3 containment. / Sherman, Michael; Trujillo, Juan; Bammes, Benjamin E.; Jin, Liang; Stumpf, Matthias W.; Weaver, Scott.

In: AIMS Biophysics, Vol. 2, No. 2, 2015, p. 153-162.

Research output: Contribution to journalArticle

Sherman, Michael ; Trujillo, Juan ; Bammes, Benjamin E. ; Jin, Liang ; Stumpf, Matthias W. ; Weaver, Scott. / Decontamination of digital image sensors and assessment of electron microscope performance in a BSL-3 containment. In: AIMS Biophysics. 2015 ; Vol. 2, No. 2. pp. 153-162.
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