Gene expression profiling data of Schizosaccharomyces pombe under nitrosative stress using differential display

Pranjal Biswas, Uddalak Majumdar, Sanjay Ghosh

Research output: Contribution to journalArticle

3 Scopus citations

Abstract

Excess production of nitric oxide (NO) and reactive nitrogen intermediates (RNIs) causes nitrosative stress on cells. Schizosaccharomyces pombe was used as a model to study nitrosative stress response. In the present data article, we have used differential display to identify the differentially expressed genes in the fission yeast under nitrosative stress conditions. We have used pure NO donor compound detaNONOate at final concentrations of 0.1 mM and 1 mM to treat the cells for 15 min alongside control before studying their gene expression profiles. At both the treated conditions, we identified genes which were commonly repressed while several genes were induced upon both 0.1 mM and 1 mM treatments. The differentially expressed genes were further analyzed in DAVID and categorized into several different pathways.

Original languageEnglish (US)
Pages (from-to)101-111
Number of pages11
JournalData in Brief
Volume6
DOIs
StatePublished - Mar 1 2016
Externally publishedYes

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Keywords

  • Differential display analysis
  • Nitric oxide
  • Nitrosative stress
  • Schizosaccharomyces pombe

ASJC Scopus subject areas

  • General
  • Education

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