High precision implementation of Steck's recursion method for use in goodness-of-fit tests

Jiefei Wang, Jeffrey C. Miecznikowski

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Classical continuous goodness-of-fit (GOF) testing is employed for examining whether the data come from an assumed parametric model. In many cases, GOF tests assume a uniform null distribution and examine extreme values of the order statistics of the samples. Many of these statistics can be expressed by a function of the order statistics and the p-values amount to a joint probability statement based on the uniform order statistics. In this paper, we utilize Steck's recursion method and propose two high precision computing algorithms to compute the p-values for these GOF statistics. The numerical difficulties in implementing Steck's method are discussed and compared with solutions provided in high precision libraries.

Original languageEnglish (US)
Pages (from-to)1348-1363
Number of pages16
JournalJournal of Applied Statistics
Volume49
Issue number6
DOIs
StatePublished - 2022
Externally publishedYes

Keywords

  • Berk Jones
  • Steck's determinant
  • goodness-of-fit

ASJC Scopus subject areas

  • Statistics and Probability
  • Statistics, Probability and Uncertainty

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