Induced membrane hypo/hyper-mechanosensitivity: A limitation of patch- clamp recording

Owen P. Hamill, Don W. McBride

    Research output: Contribution to journalReview articlepeer-review

    118 Scopus citations

    Abstract

    Practical limitations of the patch-clamp technique when recording mechanogated membrane ion channels are considered. Mechanical overstimulation of the patch or the cell from excessive suction/pressure protocols induces morphological and functional changes. In particular, the plasma membrane becomes decoupled from the underlying cytoskeleton to form either membrane blebs (cell-attached) or ghosts (whole cell). As a consequence, a membrane ion channel may show either a decrease or an increase in its native mechanosensitivity or even acquire mechanosensitivity. The effect varies with ion channel and cell type and presumably arises because of a disruption of membrane-cytoskeleton interactions. We consider that such disruptions are a pathological consequence of excessive mechanical stress, either during or after seal formation, rather than an immutable consequence of patch-clamp recording. By careful attention to the suction/pressure protocols during sealing and throughout recording, such artifacts can be avoided.

    Original languageEnglish (US)
    Pages (from-to)621-631
    Number of pages11
    JournalAnnual review of physiology
    Volume59
    DOIs
    StatePublished - 1997

    Keywords

    • channel gating
    • hyper-mechanosensitivity
    • hypo- mechanosensitivity, patch clamp
    • mechanosensitivity

    ASJC Scopus subject areas

    • Physiology

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