Abstract
Alexandrite laser ablation of enamel enhanced by indocyanine green dye was studied. Microjet system was employed to deliver precisely measured small amounts of absorbing dye solution to the site of irradiation. A sequence of physical phenomena involved in dye-enhanced laser ablation of dental enamel was revealed when laser pulse profiles were compared with the profiles of laser-induced pressure, laser-induced plasma, and ablation plume kinetics. To understand photomechanical effects on the enamel ablation, the absolute values of pressure waves were measured by calibrated wide-band acoustic transducer. Absolute amplitude and temporal profile of pressure waves, plasma emission, ablation plume kinetics, ablation efficiency, and crater quality under free-running and Q-switched ablation of enamel were studied. It was found that there is an optimal dye solution volume (100-200 nL) when the maximum ablation efficiency (30 μm/pulse) can be obtained. It was shown that the ablation efficiency under Q-switched laser irradiation is approximately one order of magnitude lower than that under free-running ablation. It was shown that Q-switched enamel ablation with dye solution is caused by the powerful recoil pressure wave with the amplitude 3-6.5 kbar. In contrast, dye-enhanced free-running enamel ablation is caused by plasma-mediated evaporation of enamel and accompanied by recoil pressure waves of lower amplitude (0.5-1 kbar) that is below mechanical damage threshold in enamel. Uneven crater walls after Q-switched ablation were observed by scanning electron microscopy (SEM). Free-running ablation makes precise craters with smooth and even crater walls.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 836-846 |
| Number of pages | 11 |
| Journal | IEEE Journal on Selected Topics in Quantum Electronics |
| Volume | 2 |
| Issue number | 4 |
| DOIs | |
| State | Published - Dec 1996 |
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ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Atomic and Molecular Physics, and Optics
Cite this
Mechanism of dye-enhanced pulsed laser ablation of hard tissues : Implications for dentistry. / Esenaliev, Rinat; Oraevsky, Alexander; Rastegar, Sohi; Frederickson, Chris; Motamedi, Massoud.
In: IEEE Journal on Selected Topics in Quantum Electronics, Vol. 2, No. 4, 12.1996, p. 836-846.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Mechanism of dye-enhanced pulsed laser ablation of hard tissues
T2 - Implications for dentistry
AU - Esenaliev, Rinat
AU - Oraevsky, Alexander
AU - Rastegar, Sohi
AU - Frederickson, Chris
AU - Motamedi, Massoud
PY - 1996/12
Y1 - 1996/12
N2 - Alexandrite laser ablation of enamel enhanced by indocyanine green dye was studied. Microjet system was employed to deliver precisely measured small amounts of absorbing dye solution to the site of irradiation. A sequence of physical phenomena involved in dye-enhanced laser ablation of dental enamel was revealed when laser pulse profiles were compared with the profiles of laser-induced pressure, laser-induced plasma, and ablation plume kinetics. To understand photomechanical effects on the enamel ablation, the absolute values of pressure waves were measured by calibrated wide-band acoustic transducer. Absolute amplitude and temporal profile of pressure waves, plasma emission, ablation plume kinetics, ablation efficiency, and crater quality under free-running and Q-switched ablation of enamel were studied. It was found that there is an optimal dye solution volume (100-200 nL) when the maximum ablation efficiency (30 μm/pulse) can be obtained. It was shown that the ablation efficiency under Q-switched laser irradiation is approximately one order of magnitude lower than that under free-running ablation. It was shown that Q-switched enamel ablation with dye solution is caused by the powerful recoil pressure wave with the amplitude 3-6.5 kbar. In contrast, dye-enhanced free-running enamel ablation is caused by plasma-mediated evaporation of enamel and accompanied by recoil pressure waves of lower amplitude (0.5-1 kbar) that is below mechanical damage threshold in enamel. Uneven crater walls after Q-switched ablation were observed by scanning electron microscopy (SEM). Free-running ablation makes precise craters with smooth and even crater walls.
AB - Alexandrite laser ablation of enamel enhanced by indocyanine green dye was studied. Microjet system was employed to deliver precisely measured small amounts of absorbing dye solution to the site of irradiation. A sequence of physical phenomena involved in dye-enhanced laser ablation of dental enamel was revealed when laser pulse profiles were compared with the profiles of laser-induced pressure, laser-induced plasma, and ablation plume kinetics. To understand photomechanical effects on the enamel ablation, the absolute values of pressure waves were measured by calibrated wide-band acoustic transducer. Absolute amplitude and temporal profile of pressure waves, plasma emission, ablation plume kinetics, ablation efficiency, and crater quality under free-running and Q-switched ablation of enamel were studied. It was found that there is an optimal dye solution volume (100-200 nL) when the maximum ablation efficiency (30 μm/pulse) can be obtained. It was shown that the ablation efficiency under Q-switched laser irradiation is approximately one order of magnitude lower than that under free-running ablation. It was shown that Q-switched enamel ablation with dye solution is caused by the powerful recoil pressure wave with the amplitude 3-6.5 kbar. In contrast, dye-enhanced free-running enamel ablation is caused by plasma-mediated evaporation of enamel and accompanied by recoil pressure waves of lower amplitude (0.5-1 kbar) that is below mechanical damage threshold in enamel. Uneven crater walls after Q-switched ablation were observed by scanning electron microscopy (SEM). Free-running ablation makes precise craters with smooth and even crater walls.
UR - http://www.scopus.com/inward/record.url?scp=0030360919&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=0030360919&partnerID=8YFLogxK
U2 - 10.1109/2944.577306
DO - 10.1109/2944.577306
M3 - Article
AN - SCOPUS:0030360919
VL - 2
SP - 836
EP - 846
JO - IEEE Journal of Selected Topics in Quantum Electronics
JF - IEEE Journal of Selected Topics in Quantum Electronics
SN - 1077-260X
IS - 4
ER -