Abstract
The resolution power of light microscope has been accurately measured (±5%) by Fourier transform of various object images and further evaluation of the highest spatial frequency in Fourier spectrum. Any unknown shape plane object with a shape feature's size smaller than the resolution to be measured was shown to provide a reliable resolution test. This simple method gives a direct measurement of the resolution power as defined by Abbe [Archiv. F. Mikroskopische Anat. 9, 413 (1873)]. The results have been justified by comparison to a standard resolution measurement by using calibrated periodic line patterns. Notably, the approach is applicable in super-resolution light microscopy (transmission, reflection, and fluorescence), where calibrated resolution targets do not occur. It was conveniently implemented by using a compact disk as a test object and free IMAGEJ imaging software.
| Original language | English (US) |
|---|---|
| Article number | 046112 |
| Journal | Review of Scientific Instruments |
| Volume | 79 |
| Issue number | 4 |
| DOIs | |
| State | Published - 2008 |
| Externally published | Yes |
ASJC Scopus subject areas
- Instrumentation
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