Pulsed laser-induced thermal damage in whole blood

T. Joshua Pfefer, Bernard Choi, Gracie Vargas, Karen M. McNally, A. J. Welch

Research output: Contribution to journalArticle

44 Citations (Scopus)

Abstract

An investigation of the effects of laser irradiation with a wavelength of 532 nm and pulse duration of 10 ms on whole blood was performed in vitro. Threshold radiant exposures for coagulation were quantified and transient radiometric temperatures were measured. The progression of effects with increasing radiant exposure from-evaporation to coagulation-induced light scattering to aggregated coagulum formation to ablation-is described. Results indicate that coagulation and ablation occur at temperatures significantly in excess of those assumed in previous theoretical studies. An Arrhenius rate process analysis based on hemoglobin data indicates good agreement with experimental results.

Original languageEnglish (US)
Pages (from-to)196-202
Number of pages7
JournalJournal of Biomechanical Engineering
Volume122
Issue number2
DOIs
StatePublished - Apr 2000
Externally publishedYes

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Coagulation
Pulsed lasers
Lasers
Blood
Hot Temperature
Ablation
Temperature
Light Coagulation
Hemoglobins
Theoretical Models
Hemoglobin
Laser beam effects
Light scattering
Evaporation
Wavelength
In Vitro Techniques

ASJC Scopus subject areas

  • Biomedical Engineering
  • Biophysics

Cite this

Pulsed laser-induced thermal damage in whole blood. / Pfefer, T. Joshua; Choi, Bernard; Vargas, Gracie; McNally, Karen M.; Welch, A. J.

In: Journal of Biomechanical Engineering, Vol. 122, No. 2, 04.2000, p. 196-202.

Research output: Contribution to journalArticle

Pfefer, TJ, Choi, B, Vargas, G, McNally, KM & Welch, AJ 2000, 'Pulsed laser-induced thermal damage in whole blood', Journal of Biomechanical Engineering, vol. 122, no. 2, pp. 196-202. https://doi.org/10.1115/1.429642
Pfefer, T. Joshua ; Choi, Bernard ; Vargas, Gracie ; McNally, Karen M. ; Welch, A. J. / Pulsed laser-induced thermal damage in whole blood. In: Journal of Biomechanical Engineering. 2000 ; Vol. 122, No. 2. pp. 196-202.
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