Requirement of yeast DNA polymerase δ in post-replicational repair of UV-damaged DNA

Carlos A. Torres-Ramos, Satya Prakash, Louise Prakash

Research output: Contribution to journalArticle

39 Citations (Scopus)

Abstract

DNA lesions in the template strand pose a block to the replication machinery. Replication across such lesions may occur by a mutagenic bypass process in which a wrong base is inserted opposite the lesion or may involve processes that are relatively error-free. Genetic studies in the yeast Saccharomyces cerevisiae have indicated the requirement of REV3-encoded DNA polymerase in mutagenic bypass. The DNA polymerase responsible for error- free bypass, however, has not been identified, but genetic studies implicating proliferating cell nuclear antigen in this process have suggested that either DNA polymerase δ or DNA polymerase ε may be involved. Here, we use temperature-sensitive (ts) conditional lethal mutations of the S. cerevisiae POL2 and POL3 genes, which encode DNA polymerase ε and δ, respectively, and show that post-replicational bypass of UV-damaged DNA is severely inhibited in the pol3-3 mutant at the restrictive temperature. By contrast, the pol2-18 mutation has no adverse effect on this process at the restrictive temperature. From these observations, we infer a requirement of DNA polymerase δ in post-replicative bypass of UV-damaged DNA.

Original languageEnglish (US)
Pages (from-to)25445-25448
Number of pages4
JournalJournal of Biological Chemistry
Volume272
Issue number41
DOIs
StatePublished - Oct 10 1997

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DNA-Directed DNA Polymerase
Yeast
Repair
Yeasts
DNA
Temperature
Saccharomyces cerevisiae
Mutation
Proliferating Cell Nuclear Antigen
Machinery
Genes

ASJC Scopus subject areas

  • Biochemistry

Cite this

Requirement of yeast DNA polymerase δ in post-replicational repair of UV-damaged DNA. / Torres-Ramos, Carlos A.; Prakash, Satya; Prakash, Louise.

In: Journal of Biological Chemistry, Vol. 272, No. 41, 10.10.1997, p. 25445-25448.

Research output: Contribution to journalArticle

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